This award was instituted in the name of Professor Jerome B. Cohen, one of the leaders in the field of X-ray analysis, and in the training of students in this art. The award is intended to recognize the outstanding achievements of student research in this field. All students who are working in the field of X-ray analysis, can submit a technical paper describing their work. The research must be original, of high quality, and must be primarily the work of the student.
Deadline: Check deadline
Funder: International Centre for Diffraction Data
Stage of Study:
Citizenship: International, U.S. Citizen